El-Mul is a technology leader & strategic OEM supplier of advanced charged particle detectors & devices.
Since 1992, El-Mul has been in the frontier of detection systems for OEM vendors in the fields of Analytic SEM and STEM, Focused Ion Beam, Mass Spectrometry and Semiconductor Metrology and Inspection e-beam tools.
Creating value for its customers through constant innovation, El-Mul is leveraging its unique experience and proprietary IP to provide comprehensive tailor-made solutions, from concept design to serial manufacturing.
Markets
Leading Technologies
ScintiFast™
ScintiFast™ is El-Mul’s flagship scintillator technology enabling the next generation of ...
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High Rate Multi Pixel
Systems utilizing multiple electron beams are an emerging semiconductor metrology ...
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SLIM™
SLIM™ is an innovative design for under-the-column BSE detection. SLIM™ puts El-Mul’s ...
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MTOF™
El-Mul’s MTOF™ technology platform is an advanced solution for time of flight mass ...
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SpectroMax™
El-Mul’s proprietary technologies enable unique solutions for compact BSE energy spectrometers...
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OptiMax™
El-Mul’s patented OptiMax™ platform utilizes an MCP-scintillator-light sensor chain for high ...
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ElIon™
El-Mul was the first to present a commercial detection module for FIB/SEM tools that combines ...
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Opal™ STEM Detector
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning ...
Read moreSolutions
As leader in its field, El-Mul’s integrated detection solutions demonstrate its pioneering spirit. Our turn-key systems combine novel or traditional charged particle sensors, optical modules and electronics, all selected and optimized for each of our customer’s instrument requirements.
