El-Mul is a technology leader & strategic OEM supplier of advanced charged particle detectors & devices.
Since 1992, El-Mul has been in the frontier of detection systems for OEM vendors in the fields of Analytic SEM and STEM, Focused Ion Beam, Mass Spectrometry and Semiconductor Metrology and Inspection e-beam tools.
Creating value for its customers through constant innovation, El-Mul is leveraging its unique experience and proprietary IP to provide comprehensive tailor-made solutions, from concept design to serial manufacturing.
High Rate Multi Pixel
Opal™ STEM Detector
As leader in its field, El-Mul’s integrated detection solutions demonstrate its pioneering spirit. Our turn-key systems combine novel or traditional charged particle sensors, optical modules and electronics, all selected and optimized for each of our customer’s instrument requirements.