In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscope (STEM) suitable for life science cryo-tomography, material science differential phase contrast (DPC) and other STEM applications. The solid-state sensor can work in a 300keV STEM.
It has 4-quadrant annular bright field, dark field and high angle annular dark field segments. A central hole enables the simultaneous use of a bright field or EELS detector.
Its in-vacuum pre-amplifier is located close to the sensor to ensure low-noise performance and the analog output signal can be connected to any signal digitizer.