Analytical SEM/STEM

From traditional Everhart-Thornley detector, through a selection of 
solid-state detectors and culminating with complex in-column, energy filter BSE detectors, El-Mul has vast experience in turning proprietary and generic technologies into a fit-for-purpose, engineered detectors suitable for a variety of imaging applications.

Technologies

TechnologyDescription
ScintiFast™ ScintiFast™ is El-Mul’s flagship scintillator technology enabling the next generation of detectors with shorter response time and higher sensitivity ...
SpectroMax™El-Mul’s proprietary technologies enable unique solutions for compact BSE energy spectrometers. El-Mul's unique high-resistivity coating stands at the forefront of our energy filtering detection platform ...
ElIon™ El-Mul was the first to present a commercial detection module for FIB/SEM tools that combines secondary ion (SI) and secondary electron (SE) modes of detection in a single compact device ...
Opal™ STEM DetectorIn a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscope (STEM) suitable for life science cryo-tomography ...
SLIM™SLIM™ is an innovative design for under-the-column BSE detection. SLIM™ puts El-Mul’s ScintiFast™ together with a segmented, shaped light guide and Silicon ...
3MaxEl-Mul's 3Max concept brings exciting new life to the Everhart-Thornley (ET) detection scheme. The unique design can be operated in two modes ...
Chamber DetectorsEl-Mul manufactures a range of chamber detectors, providing a solution for desk-top SEMs, standard SEMs, FIB/SEM and lithography systems ...
In-Lens DetectorsIn order to meet the challenges of in-lens detection we have developed annular, scintillator based SE and BSE detectors. These designs feature a small through-hole that minimizes dead area ...
Solid State DetectorsAs the world of electron microscopy becomes more diversified, so do the specifications for solid state detectors. El-Mul offers several solid-state technologies in order to ensure best choice ...
High Rate Multi PixelSystems utilizing multiple electron beams are an emerging semiconductor metrology technology that aims to increase throughput ...
WETSEM™WETSEM™ is an enabler for the imaging of fully wet samples in any standard SEM. It extends the capabilities of your instrument without additional capital investment ...