El-Mul supplies expert particle detection solutions to leading makers of semiconductor manufacturing tools. We have established a sound reputation as a highly successful developer of advanced hardware for metrology, lithography, inspection and other market segments.

Our product line includes SEM electron detectors, FIB ion detectors, combined electron and ion detectors and, in the future, a new line of electron beam source products, based on our patented carbon nanotube (CNT) field emitters.