El-Mul supplies expert particle detection solutions to leading scanning electron, transmission electron microscope and focused ion beam manufacturers. We have established a sound reputation as a highly successful developer of advanced hardware for imaging, testing and industrial research applications.

Our product line includes SEM electron detectors, FIB ion detectors, combined electron and ion detectors and, in the future, a new line of electron beam source products, based on our patented carbon nanotube (CNT) field emitters.